Passionate engineer with 10 years of experience in Failure Analysis (FA) field. Specialized in Fault Isolation (FI), Intel Process & Automated Test Equipment testing. Proven track record in FAFI support in cross-functional teams with countless cases solved. Ready to bring forward exceptional expertise and eager to explore new experience in semiconductor field.
Fault Isolation
Failure Analysis
UNIX Environment
Data Analysis
Test Methodology
Python
MPE Division Recognition Award Q4'24
CQN Labs Department Award Q1'23
Customer First Award Q4'22
CQN Division Recognition Award Q4'22
CQN Division Recognition Award Q1'22
Division Recognition Award Q1'22
Lee, Jin Yee | jin.yee.lee@intel.com
Engineering Manager, Intel Corp
+60125592469